High Power Beam Analysis
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M2 Beam Analyzer HP – Knife Edge
- Combines all ISO compliance accuracy
- Special version for high power measurements up to 4 kWatt
- Flexible, with removable measuring head for regular laser beam profiling
- Interchangeable filter drawers
- Adjustment center of rotation coincides with the center of input lens

Specifications
Parameters | Value |
---|---|
Technology | Double Reflection sampling head built-in with measuring instrument, USB system |
Spectral Range (nm) | 220 – 1550 with interchangeable measuring head Silicon head 350-1100 |
Beam Power Range | 4 kW |
Beam Size | 8 mm, absolute maximum 10 mm |
Minimum Detectable Divergence Angle | Better than 0.1 mRad |
Accuracy | M² Values & General Parameters Accuracy: ±5% |
Typical Measurement Time | 10 seconds, better if the system is allowed to cool off after two minutes |
Cooling conditions | Filtered pressurized air of 6-8 Bar |
Method | Main beam is sampled and directed towards knife-edge measurement head |
Beam dumping | Supplied by user |
Adjustment | Built-in pan/tilt |
Construction | Aluminium |
Lens Focal Length | 300 mm (at 632.6 nm) |
Lens Diameter | 25 mm |
Number of Scan Steps | 140 |
Minimum Step Size | 100 µm |
Scan Length | 280 mm |
Weight | 2.5 Kg |
Dimensions | 85 x 160 x 530 mm |
Mounting | M6 or ¼” screws |
Mechanical Adjustment | Horizontal angle: ±1.5° Vertical angle: ±1.5° |
Cable Length | 2.5 m |
The application program is compatible with Windows 7/8/10 OS (32 & 64 bit). For custom integration, an SDK package software is offered as standard.
Ordering Information
M2Beam-Si-HP: measurement device for silicon range (350 – 1100nm)
M2Beam-UV-HP: measurement device for silicon range (190 – 1100nm)
M2Beam-IR-HP: InGaAs measurement device (800 – 1800nm)*
*For IR possible sensors – InGaAs 3 mm dia., 5 mm dia., 10 mm dia.
Contact sales@duma.co.il for other versions.