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High Power Beam Analysis

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M2 Beam Analyzer HP – Knife Edge

  • Combines all ISO compliance accuracy
  • Special version for high power measurements up to 4 kWatt
  • Flexible, with removable measuring head for regular laser beam profiling
  • Interchangeable filter drawers
  • Adjustment center of rotation coincides with the center of input lens

Specifications

Parameters Value
Technology  Double Reflection sampling head built-in with measuring instrument, USB system 
Spectral Range (nm)  220 – 1550 with interchangeable measuring head
Silicon head 350-1100 
Beam Power Range  4 kW 
Beam Size  8 mm, absolute maximum 10 mm 
Minimum Detectable Divergence Angle  Better than 0.1 mRad 
Accuracy  M² Values & General Parameters Accuracy:
±5% 
Typical Measurement Time  10 seconds, better if the system is allowed to cool off after two minutes 
Cooling conditions  Filtered pressurized air of 6-8 Bar 
Method  Main beam is sampled and directed towards knife-edge measurement head 
Beam dumping  Supplied by user 
Adjustment  Built-in pan/tilt 
Construction  Aluminium 
Lens Focal Length  300 mm (at 632.6 nm) 
Lens Diameter  25 mm 
Number of Scan Steps  140 
Minimum Step Size  100 µm 
Scan Length  280 mm 
Weight  2.5 Kg 
Dimensions  85 x 160 x 530 mm 
Mounting  M6 or ¼” screws 
Mechanical Adjustment  Horizontal angle: ±1.5°
Vertical angle: ±1.5° 
Cable Length  2.5 m 

The application program is compatible with Windows 7/8/10 OS (32 & 64 bit). For custom integration, an SDK package software is offered as standard.

Ordering Information

M2Beam-Si-HP: measurement device for silicon range (350 – 1100nm)
M2Beam-UV-HP: measurement device for silicon range (190 – 1100nm)
M2Beam-IR-HP: InGaAs measurement device (800 – 1800nm)*

*For IR possible sensors – InGaAs 3 mm dia., 5 mm dia., 10 mm dia.

Contact sales@duma.co.il for other versions.

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