Large Aperture Beam Profilers
BeamOn LA U3 – E
IPL (Intense Pulsed light) & Large Laser beams Beam Profiler
The BeamOn LA U3 – E system is a beam diagnostics measurement system for real-time measurement of CW or Pulsed laser beams. It provides laser beam parameters, such as: beam width, shape, position, power, and intensity profiles. Software also provides report function for beam analysis settings and results.

Specifications
Parameters | Value |
---|---|
Spectral Response | 350 – 1150 nm |
Sensor Active area | ⌀60 mm (⌀55 mm calibrated) |
Resolution (H x V pixels) | 1936 x 1216 |
Exposure | 32 µsec to 2 sec (By software) |
Beam Resolution | Better than 100 µm |
Beam Accuracy | ±2% |
Damage threshold | 100 W/cm² (Contact factory for continues operation and cooling accessary) |
Saturation | 100 W/cm² with ND1000 filter |
Sensitivity | 0.1 μW/cm² at 633nm (VIS-NIR) |
Cooling conditions | Filtered pressurized air of 6-8 Bar |
Minimal beam size | ⌀5 mm |
Frame Rate | > 25 fps (AOI) |
Filter Slider Assembly | Built-in 5xND filters on a slider |
Interface | USB 3.0 |
Pixel Bit Depth | 16 bits |
Synchronization | •Software •Hardware (external trigger signal) |
Mounting | Built-in |
Built-in slider filter | ND8, ND64, ND200, ND400, ND1000 |
Housing Size (L x W x H) in mm | 218 x 172 x 113 |
Power Requirements | ~2 Watt (Via USB 3.0 interface) |
Weight (typical) | 1.1 kg with cable |
The application program is compatible with Windows 7/8/10 OS (32 & 64 bit). For custom integration, an SDK package software is offered as standard.
Ordering Information
The system comes with sensor head, a built-in filter slider with a set of 5xND filters, USB3.0 cable, software and user manual on CD / Flash Disc, carrying case.
BeamOn-LA-U3-E: for spectral range 350-1150 nm